Modal refractive index measurement in nanowire lasers—a correlative approach
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چکیده
منابع مشابه
Simple polarimetric approach to direct measurement of the near-surface refractive index in graded-index films.
In the standard M-line method for the characterization of graded-index film, an analytical curve is fitted to the waveguide mode measurements and extrapolated to provide the refractive index in the zero-depth limit. Here we review our polarimetric approach to a direct near-surface measurement, which complements the M-line method. Also, we present its new and more straightforward version, which ...
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ژورنال
عنوان ژورنال: Nano Futures
سال: 2018
ISSN: 2399-1984
DOI: 10.1088/2399-1984/aad0c6